AS 2536-1982

Full Description

Specifies surface texture parameters in terms of roughness and waviness used in the quantitative expression of surface texture generally, and includes methods of assessing these properties, together with requirements for measuring instruments. It includes notes on the use of stylus instruments, the specification and production of surface texture measurement of the microtopography of surfaces, surface topography parameters and functions, calibration of stylus instruments and method divergence, and includes an extensive bibliography. See more